The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 12, 2019
Filed:
May. 30, 2017
University of Electronic Science and Technology of China, Chengdu, Sichuan, CN;
UNIVERSITY OF ELECTRONIC SCIENCE AND TECHNOLOGY OF CHINA, Chengdu, CN;
Abstract
A method automatically separates out the defect image from a thermogram sequence based on the physical characteristics of the defect of a conductive material in electromagnetic field. Defect area radiates more heat than other area, when it is mapped to the histogram of the image to be separated, the defect area is located in the top-end of histogram, and the proportion of defect area is smaller to the background or other area. The method equally divides the histogram of the image to be separated into multi groups, and calculates the first derivative kof total pixel number Sof group i, finds the maximum absolute value of k, i.e. |k|, where i is expressed as i; if iis the last group, Wis regarded as threshold T, otherwise, Wis selected as threshold T. The pixels that less than threshold T are removed to obtain the defect image in ECPT.