The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 12, 2019
Filed:
Jan. 06, 2015
International Business Machines Corporation, Armonk, NY (US);
Tara Astigarraga, Fairport, NY (US);
Christopher V. DeRobertis, Hopewell Junction, NY (US);
Louie A. Dickens, Tucson, AZ (US);
Michael E. Starling, Bonsall, CA (US);
Daniel J. Winarski, Tucson, AZ (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A SAN testing application may be provided to restrict the utilization of one or more SAN device resources. The restricted, or throttled, resource(s) enables a smaller load to stress a SAN switch to effectively emulate a larger load. Resource throttling may, for example, result in the rapid filling of switch buffers and corresponding computational stress. The emulated load allows for all ports of a SAN switch to be simultaneously tested without the need or expense of a large number computing devices stressing the SAN. The SAN device with throttled resource(s) may be located within a testing environment or may be located in a functioning SAN to determine SAN bottlenecks prior to critical loading.