The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 12, 2019
Filed:
Sep. 06, 2016
Applicants:
The Regents of the University of California, Oakland, CA (US);
Nanyang Technological University, Singapore, SG;
Inventors:
Laura Waller, Berkeley, CA (US);
Jingshan Zhong, Berkeley, CA (US);
Lei Tian, Berkeley, CA (US);
Justin Dauwels, Singapore, SG;
Assignees:
THE REGENTS OF THE UNIVERSITY OF CALIFORNIA, Oakland, CA (US);
NANYANG TECHNOLOGICAL UNIVERSITY, Singapore, SG;
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G02B 21/36 (2006.01); G02B 27/52 (2006.01); G02B 27/00 (2006.01); G06T 5/10 (2006.01); G02B 21/14 (2006.01);
U.S. Cl.
CPC ...
G02B 21/367 (2013.01); G02B 27/0012 (2013.01); G02B 27/52 (2013.01); G06T 5/10 (2013.01); G02B 21/14 (2013.01); G06T 2207/10056 (2013.01); G06T 2207/20024 (2013.01);
Abstract
A system and method for incorporating partially coherent illumination models into the problem of phase and amplitude retrieval from a stack of intensity images. The recovery of phase could be realized by many methods, including Kalman filters or other nonlinear optimization algorithms that provide least squares error between the measurement and estimation.