The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 12, 2019
Filed:
Mar. 07, 2016
Moe Z. Win, Framingham, MA (US);
Wenhan Dai, Cambridge, MA (US);
Yuan Shen, Allston, MA (US);
Massachusettts Institute of Technology, Cambridge, MA (US);
Abstract
A method for localizing one or more devices in an environment make use of repeated allocation of resources for one or more sensor measurements. Each sensor measurement is characterized by the amount of resources allocated to the measurement, by a quality factor, and by direction-dependent characteristics of information that is obtainable from that sensor measurement. Knowledge of a current location of each of the one or more devices determined from past sensor measurements is characterized by a distribution, with each of the distribution containing information about the current location of the device, including the direction-dependent information and the uncertainty of the location. The allocation of resources makes use of the quality factors and direction-dependent characteristics of the sensor measurements, in combination with the distributions characterizing the current location of each of the one or more devices to allocate a variable amount of a resource to each of the one or more sensor measurements.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile