The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 12, 2019

Filed:

Nov. 20, 2015
Applicant:

Keysight Technologies, Inc., Minneapolis, MN (US);

Inventor:

Takashi Kitagaki, Tokyo, JP;

Assignee:

Keysight Technologies, Inc., Santa Rosa, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 33/02 (2006.01); H03M 1/06 (2006.01); H03M 1/10 (2006.01); H03M 1/12 (2006.01); G01R 19/00 (2006.01); G01R 23/20 (2006.01); G01R 15/00 (2006.01); G01R 13/00 (2006.01);
U.S. Cl.
CPC ...
G01R 19/0007 (2013.01); G01R 19/0053 (2013.01); G01R 19/0092 (2013.01); G01R 23/20 (2013.01); G01R 13/00 (2013.01); G01R 15/005 (2013.01);
Abstract

A measuring apparatus is provided for electrical signals. The measuring apparatus includes an analog-to-digital (A/D) converter configured to A/D-convert an analog signal to be measured, and an integrator configured to perform integration time processing for a plurality of digital values output from the A/D converter based on an integration time. The integrator is configured to output a plurality of measured values obtained by the integration time processing. A noise level calculation unit is configured to calculate a noise level of the analog signal to be measured from the plurality of measured values obtained by the integration time processing, and a display unit is configured to display noise levels corresponding to a plurality of integration times.


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