The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 12, 2019
Filed:
Oct. 17, 2017
Universal Enterprises, Inc., Beaverton, OR (US);
Sean Patrick Tierney, Milwaukie, OR (US);
David Lauren Wheaton, Sherwood, OR (US);
Michael John Kane, Portland, OR (US);
Kane USA, Inc., Beaverton, OR (US);
Abstract
A multifunction testing and measuring device having a probe body with an elongated portion extending outward from a rearward main body portion to a hook-shaped forward end, the hook-shaped end useful for isolating a conductor under test, a slide closure member adapted to slide longitudinally forward from a rearward open position to a forward closed position, the closed position useful to capture the conductor under test within a space encircled by the combination of the hook-shaped end, the closed slide closure member, and the rearward main body, with the space encircled including a current sensing zone, and having test leads integral to and stowable on the main body. The multi tester comprises circuitry adapted for detecting a magnetic flux generated by an electric current passing through the conductor under test positioned within the current sensing zone, for sensing current and inrush current, as well as selectably measuring voltage, continuity, and resistance between the test leads.