The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 12, 2019

Filed:

Nov. 15, 2016
Applicant:

Technoprobe S.p.a., Cernusco Lombardone, IT;

Inventors:

Roberto Crippa, Cernusco Lombardone, IT;

Giuseppe Crippa, Cernusco Lombardone, IT;

Raffaele Vallauri, Cernusco Lombardone, IT;

Assignee:

TECHNOPROBE S.P.A., Cernusco Lombardone, IT;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 1/067 (2006.01); H01R 13/03 (2006.01); H01R 13/24 (2006.01); G01R 1/073 (2006.01);
U.S. Cl.
CPC ...
G01R 1/06738 (2013.01); G01R 1/06755 (2013.01); G01R 1/06761 (2013.01); G01R 1/073 (2013.01); G01R 1/07357 (2013.01); H01R 13/03 (2013.01); H01R 13/2464 (2013.01); G01R 1/06716 (2013.01); G01R 1/07314 (2013.01);
Abstract

A contact probe of a testing head of a testing apparatus of electronic devices comprises respective end portions adapted to contact respective contact pads and a body essentially extended in a longitudinal direction between the end portions, at least one end portion comprising an insert made of a first conductive material having a hardness being greater than a second conductive material making the contact probe which is supported by a section of the end portion, the section being made of the second conductive material and being shaped in a complementary way with respect to the insert and having respective abutting surfaces facing and adhering to respective abutting surfaces of the insert.


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