The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 12, 2019
Filed:
Nov. 25, 2016
Samsung Electronics Co., Ltd., Suwon-si, KR;
Yeong Bae Yeo, Seoul, KR;
Sil Park, Gwangmyeong-si, KR;
SAMSUNG ELECTRONICS CO., LTD., Suwon-si, KR;
Abstract
A test apparatus for measuring the temperature of a reactor using a thermochromic pigment, and a method for controlling the test apparatus are disclosed, based on a technology for irradiating light of different wavelengths on a thermochromic pigment accommodated in a reactor and estimating temperature of the reactor using a difference between absorbance values corresponding to the light of the different wavelengths. The test apparatus includes at least one light emitter configured to irradiate light of different wavelengths onto a chamber included in the reactor, a light receiver configured to receive the light that propagates through the chamber, and a controller configured to measure absorbance values of the thermochromic pigment in correspondence to the different wavelengths of the light, to calculate a difference between the measured absorbance values, and to determine a temperature of the reactor in correspondence to the calculated difference between the absorbance values.