The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 12, 2019

Filed:

Apr. 14, 2015
Applicants:

M-i L.l.c., Houston, TX (US);

Schlumberger Norge As, Tananger, NO;

Inventors:

Egil Ronaes, Hundvag, NO;

Michael A. Freeman, Kingwood, TX (US);

Assignees:

M-I L.L.C., Houston, TX (US);

SCHLUMBERGER NORGE AS, Tananger, NO;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 15/02 (2006.01); E21B 21/08 (2006.01); G01N 15/14 (2006.01); E21B 47/00 (2012.01); E21B 47/10 (2012.01); G01N 15/00 (2006.01);
U.S. Cl.
CPC ...
G01N 15/0205 (2013.01); E21B 21/08 (2013.01); E21B 47/00 (2013.01); E21B 47/102 (2013.01); G01N 15/1459 (2013.01); G01N 2015/0053 (2013.01);
Abstract

A method for measuring particle size distribution in a fluid material, involving inserting a laser beam instrument directly in the fluid flow line, wherein the laser beam instrument focuses a laser beam on a window directly coupled with the fluid flow line, wherein the fluid flow line comprises a fluid having a plurality of particles of different sizes, measuring a diameter of at least one particle in the fluid flow line by reflectance of the at least one particle as the at least one particle passes through the focused laser beam, and determining a duration of reflection of the at least one particle, and obtaining a count of particles in each of a pre-set range group of particle sizes, wherein the count of particles is used to determine particle size distribution in the fluid flow line.


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