The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 12, 2019
Filed:
May. 12, 2016
Inb Vision Ag, Magdeburg, DE;
Hagen Wiest, Magdeburg, DE;
Wolfram Schmidt, Stadt Falkenstein, DE;
Robert Wagner, Neuburg am Inn, DE;
INB Vision AG, Magdeburg, DE;
Abstract
The aim of the invention is a quick and very precise reconstruction of an object. This is achieved by a device and a method for detecting an image of a preferably structured surface of an object (), comprising at least one pattern projection unit for illuminating the object () and at least one imaging unit () for capturing images of projected patterns. A temporal and/or spatial analysis of received images or image sequences is carried out in order to reconstruct the surface. The at least one pattern projection unit is designed to generate patterns using a diffraction of light on an optical grating. Furthermore, the method for detecting images is characterized in that by using the temporal and/or spatial analysis of the captured images or image sequences, corresponding pixels are ascertained by means of algorithms, said pixels together with an imaging function allowing a triangulation of surface points.