The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 12, 2019
Filed:
Nov. 28, 2016
Canon Kabushiki Kaisha, Tokyo, JP;
Yuya Nishikawa, Utsunomiya, JP;
CANON KABUSHIKI KAISHA, Tokyo, JP;
Abstract
Provided is a measuring apparatus which includes an imaging device configured to image an object to obtain image data and a processor configured to process the image data to recognize a region of the object. The processor is configured to perform feature extraction on the image data to obtain first feature data, perform projection of a three-dimensional model of the object, whose region is recognized based on the image data, onto a predetermined surface and perform the feature extraction on image data obtained by the projection to obtain second feature data, and perform determination of whether there is an unrecognized object based on the first feature data and the second feature data.