The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 12, 2019
Filed:
Apr. 04, 2014
Panagene Inc., Daejeon, KR;
Goon Ho Joe, Daejeon, KR;
Sung-Kee Kim, Daejeon, KR;
Heekyung Park, Daejeon, KR;
Chwang Siek Park, Daejeon, KR;
Se Ryun Kim, Daejeon, KR;
Yongtae Kim, Sejong, KR;
Su Nam Kim, Gyeongsangnam-do, KR;
PANAGENE INC., Daejeon, KR;
Abstract
Provided are a PNA probe for detecting nucleotide polymorphism of a target gene, a melting curve analysis method for detecting the nucleotide polymorphism of the target gene using the same, a nucleotide polymorphism analysis method of a target gene including the melting curve analysis method, and a kit for detecting the nucleotide polymorphism of the target gene containing the PNA probe. It is characterized that the PNA probe according to the present invention contains negative charge molecules. The modified PNA probe according to the present invention contains the negative charge molecules to have a high recognition ability with respect to a target DNA and a high coupling ability to the target DNA and to be rapidly dissociated by heat, such that the nucleotide polymorphism analysis may be relatively easily performed even in a heterozygous sample showing two melting curve graphs, and two or more adjacent single nucleotide polymorphisms may be simultaneously analyzed.