The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 12, 2019

Filed:

Apr. 21, 2017
Applicant:

Seiko Epson Corporation, Tokyo, JP;

Inventor:

Tetsuya Matsumura, Nagano, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B41J 25/308 (2006.01); B41J 2/14 (2006.01); B41J 11/42 (2006.01); H04N 1/52 (2006.01);
U.S. Cl.
CPC ...
B41J 25/308 (2013.01); B41J 2/14 (2013.01); B41J 11/425 (2013.01); H04N 1/52 (2013.01);
Abstract

A sub-scanning distance in a case in which a gap between a recording head and a platen is broader than a second gap broader a first gap is lengthened more than a sub-scanning distance in a case in which the gap is the first gap more when sub-scanning which is sub-scanning of a longer distance than a pitch of nozzles of a nozzle line in a sub-scanning direction is performed. A sub-scanning distance in a case in which the record density of a print image of a specific print region is second record density higher than first record density may also be lengthened more than a sub-scanning distance in a case in which the record density is the first record density when the sub-scanning which is the sub-scanning of the longer distance than the pitch of the nozzles of the nozzle line in the sub-scanning direction is performed.


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