The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 12, 2019

Filed:

Mar. 15, 2013
Applicant:

Nlight Photonics Corporation, Vancouver, WA (US);

Inventors:

Scott R. Karlsen, Battle Ground, WA (US);

Keith Kennedy, Vancouver, WA (US);

Robert J. Martinsen, West Linn, OR (US);

Assignee:

nLIGHT, Inc., Vancouver, WA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B23K 26/00 (2014.01); B23K 26/06 (2014.01); B23K 26/073 (2006.01); B23K 26/36 (2014.01); B23K 26/211 (2014.01); B23K 26/0622 (2014.01); B23K 26/60 (2014.01); B23K 26/354 (2014.01);
U.S. Cl.
CPC ...
B23K 26/0608 (2013.01); B23K 26/0613 (2013.01); B23K 26/0622 (2015.10); B23K 26/0732 (2013.01); B23K 26/0738 (2013.01); B23K 26/211 (2015.10); B23K 26/354 (2015.10); B23K 26/36 (2013.01); B23K 26/60 (2015.10);
Abstract

Multi-beam, multi-wavelength processing systems include two or more lasers configured to provide respective beams to a substrate. The beams have wavelengths, pulse durations, beam areas, beam intensities, pulse energies, polarizations, repetition rates, and other beam properties that are independently selectable. Substrate distortion in processes requiring local heating can be reduced by preheating with a large area beam at a first wavelength followed by exposure to a focused beam at a second wavelength so as to heat a local area to a desired process temperature. For some processing, multiple wavelengths are selected to obtain a desired energy deposition within a substrate.


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