The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 05, 2019

Filed:

Jun. 16, 2017
Applicant:

Raytheon Company, Waltham, MA (US);

Inventors:

Stephen P. Shaffer, West Hills, CA (US);

Stephen M. Palik, Playa Vista, CA (US);

Hector A. Quevedo, Redondo Beach, CA (US);

Assignee:

RAYTHEON COMPANY, Waltham, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/335 (2011.01); H04N 3/14 (2006.01); H04N 5/372 (2011.01); H04N 5/3725 (2011.01); H04N 5/349 (2011.01); H04N 5/374 (2011.01); H04N 5/376 (2011.01); H04N 5/378 (2011.01);
U.S. Cl.
CPC ...
H04N 3/1543 (2013.01); H04N 5/349 (2013.01); H04N 5/378 (2013.01); H04N 5/3725 (2013.01); H04N 5/3743 (2013.01); H04N 5/3765 (2013.01); H04N 5/37206 (2013.01); H04N 5/37213 (2013.01);
Abstract

According to one aspect, embodiments herein provide a TDI sensor comprising a plurality of light sensing elements arranged in a row, each configured to accumulate charge proportional to an intensity of light incident on it from a field of view, and means for improving the sampling resolution of the TDI sensor by electronically introducing phase shift between a first set of image data generated by the plurality of light sensing elements at a first phase and a second set of image data generated by the plurality of light sensing elements at a second phase, for reading out the first set of image data and the second set of image data from a light sensing element at an end of the row of light sensing elements, and for generating an image of the field of view based on the two sets of phase shifted image data.


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