The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 05, 2019
Filed:
Dec. 22, 2014
Emc Ip Holding Company Llc, Hopkinton, MA (US);
Binhua Lu, Shanghai, CN;
Xiaogang Wang, Shanghai, CN;
Dazhi Dong, Shanghai, CN;
Xing Chen, Shanghai, CN;
Norman Speciner, Medway, MA (US);
EMC IP Holding Company LLC, Hopkinton, MA (US);
Abstract
Described are techniques for performing system management. A first policy definition of a first policy is received. The first policy definition includes information identifying a first criterion, a first resource of the system, and a first action to be taken. It is determined whether a condition of the first policy is met. The condition includes the first criterion. Responsive to determining that the condition is met, first processing is performed that includes performing the first action.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile