The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 05, 2019

Filed:

Aug. 22, 2017
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventor:

Won-Hyung Song, Osan-si, KR;

Assignee:

SAMSUNG ELECTRONICS CO., LTD., Samsung-ro, Yeongtong-gu, Suwon-si, Gyeonggi-do, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11C 7/06 (2006.01); H03M 13/09 (2006.01); G06F 11/10 (2006.01); G11C 7/10 (2006.01); G11C 11/4076 (2006.01); G11C 29/52 (2006.01); H03M 13/15 (2006.01); H03M 13/29 (2006.01); G11C 5/04 (2006.01); G11C 29/04 (2006.01);
U.S. Cl.
CPC ...
H03M 13/095 (2013.01); G06F 11/1048 (2013.01); G11C 7/1045 (2013.01); G11C 11/4076 (2013.01); G11C 29/52 (2013.01); H03M 13/151 (2013.01); H03M 13/2906 (2013.01); G11C 5/04 (2013.01); G11C 2029/0411 (2013.01);
Abstract

A memory device that checks an error of a memory cell and a memory module including the same are disclosed. The memory module includes a first memory device and a second memory device. The first memory device includes a first area in which normal data are stored, and a second area in which error check data are stored. The second memory device stores reliability information about the normal data that is stored in the first area of the first memory device. The first memory device outputs a result of comparing the normal data read from the first area of the first memory device to the error check data read from the second area of the first memory device.


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