The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 05, 2019

Filed:

Sep. 16, 2016
Applicant:

Apple Inc., Cupertino, CA (US);

Inventors:

Chang Ming Lu, Taoyuan, TW;

Chia-Yu Chen, Taoyuan, TW;

Chih Pang Chang, Taoyuan, TW;

Ching-Sang Chuang, Sunnyvale, CA (US);

Hung-Che Ting, Taoyuan, TW;

Jung Yen Huang, Taipei, TW;

Sheng Hui Shen, Taoyuan, TW;

Shih Chang Chang, Cupertino, CA (US);

Tsung-Hsiang Shih, Taoyuan, TW;

Yu-Wen Liu, Taoyuan, TW;

Yu Hung Chen, Pingchen, TW;

Kai-Chieh Wu, Taipei, TW;

Lun Tsai, Taoyuan, TW;

Takahide Ishii, Taoyuan, TW;

Chung-Wang Lee, Longtan, TW;

Hsing-Chuan Wang, Taoyuan, TW;

Chin Wei Hsu, Chuibei, TW;

Fu-Yu Teng, Longtan, TW;

Assignee:

Apple Inc., Cupertino, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/768 (2006.01); H01L 21/02 (2006.01); H01L 21/027 (2006.01); H01L 21/77 (2017.01);
U.S. Cl.
CPC ...
H01L 21/76834 (2013.01); H01L 21/0273 (2013.01); H01L 21/02244 (2013.01); H01L 21/02252 (2013.01); H01L 21/02255 (2013.01); H01L 21/7685 (2013.01); H01L 21/76877 (2013.01); H01L 21/77 (2013.01);
Abstract

A component such as a display may have a substrate and thin-film circuitry on the substrate. The thin-film circuitry may be used to form an array of pixels for a display or other circuit structures. Metal traces may be formed among dielectric layers in the thin-film circuitry. Metal traces may be provided with insulating protective sidewall structures. The protective sidewall structures may be formed by treating exposed edge surfaces of the metal traces. A metal trace may have multiple layers such as a core metal layer sandwiched between barrier metal layers. The core metal layer may be formed from a metal that is subject to corrosion. The protective sidewall structures may help prevent corrosion in the core metal layer. Surface treatments such as oxidation, nitridation, and other processes may be used in forming the protective sidewall structures.


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