The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 05, 2019

Filed:

Jul. 21, 2017
Applicant:

Atonarp Inc., Tokyo, JP;

Inventors:

Anand Pandurangan, San Jose, CA (US);

Siva Selvaraj, San Jose, CA (US);

Anoop Hegde, Milpitas, CA (US);

Assignee:

ATONARP INC., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/02 (2006.01); H01J 49/00 (2006.01); H01J 49/42 (2006.01); H01J 49/08 (2006.01);
U.S. Cl.
CPC ...
H01J 49/0036 (2013.01); H01J 49/0013 (2013.01); H01J 49/022 (2013.01); H01J 49/025 (2013.01); H01J 49/08 (2013.01); H01J 49/4215 (2013.01);
Abstract

Methods and circuits for detecting an ion current in a mass spectrometer are described. A circuit and a method may involve converting, over a length of integration time, the ion current to a voltage ramp by an integrating circuit having a gain setting. The circuit and the method may also involve determining a slope of the voltage ramp. The circuit and the method may also involve determining a magnitude of the ion current based on the slope of the voltage ramp and the gain setting. The circuit and the method may further involves determining an out-of-range state based on the voltage ramp and adjusting the gain setting of the integrating circuit, or the length of integration time or both, in response to the determining of the out-of-range state.


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