The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 05, 2019

Filed:

Oct. 25, 2017
Applicant:

Fujitsu Limited, Kawasaki-shi, Kanagawa, JP;

Inventors:

Yoshitsugu Goto, Kawasaki, JP;

Makoto Suwada, Kawasaki, JP;

Assignee:

FUJITSU LIMITED, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 7/00 (2006.01); G11C 11/406 (2006.01); G11C 8/12 (2006.01); G11C 5/04 (2006.01); G11C 7/04 (2006.01); G06F 13/16 (2006.01); H01L 25/00 (2006.01);
U.S. Cl.
CPC ...
G11C 7/00 (2013.01); G06F 13/1636 (2013.01); G11C 5/04 (2013.01); G11C 7/04 (2013.01); G11C 8/12 (2013.01); G11C 11/40607 (2013.01); G11C 11/40618 (2013.01); G11C 11/40626 (2013.01); H01L 25/00 (2013.01); G11C 2211/4062 (2013.01);
Abstract

A semiconductor device in which a plurality of chips each including a memory circuit are stacked, the semiconductor device includes measurement circuitry each of which is disposed in each of a plurality of memory areas of the plurality of chips and each of which measures a temperature, calculation circuitry that calculates a temperature of each of the memory areas based on the temperature measured by the measurement circuitry and a temperature obtained from a thermal resistance model of the semiconductor device, and control circuitry that sets a refresh interval of each of the memory areas based on the temperature of each of the memory areas, which has been calculated by the calculation circuitry, and performs a refresh operation of the memory circuit of each of the memory areas at the set refresh interval.


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