The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 05, 2019

Filed:

Jul. 13, 2016
Applicant:

Sung Jae Cho, Anyang-is, Gyeonggi-do, KR;

Inventor:

Sung Jae Cho, Anyang-is, Gyeonggi-do, KR;

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G09F 19/12 (2006.01); G02B 27/22 (2018.01); G02B 3/00 (2006.01); G09F 3/00 (2006.01); G09F 3/02 (2006.01);
U.S. Cl.
CPC ...
G09F 19/12 (2013.01); G02B 3/0043 (2013.01); G02B 3/0056 (2013.01); G02B 3/0075 (2013.01); G02B 27/2214 (2013.01); G09F 3/02 (2013.01); G09F 3/0292 (2013.01); G09F 2003/0213 (2013.01); G09F 2003/0276 (2013.01);
Abstract

A 3-D label is disclosed including moving patterns using fine patterns and microlenses, including a lens layer in which a pattern display unit having microlenses that are convex in a semicircumferential form arranged at specific intervals and to represent patterns formed in a pattern layer regardless of a visual field focal length and a secret unit placed on one side of the pattern display unit and displaying intended patterns formed in the pattern layer when a predetermined visual field focal length is reached are integrated and formed; and the pattern layer disposed under the lens layer and having patterns formed thereon so that the distance between the central point of each of the microlenses and the central point of an adjacent microlens is matched with the distance between the central point of each of pattern cells and the central point of an adjacent pattern cell in the state.


Find Patent Forward Citations

Loading…