The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 05, 2019
Filed:
Aug. 10, 2016
Instarecon, Inc., Urbana, IL (US);
Jeffrey Brokish, Savoy, IL (US);
Yoram Bresler, Urbana, IL (US);
InstaRecon, Urbana, IL (US);
Abstract
Methods and systems for computed tomography. A subject is imaged with a divergent beam source using a plurality of source positions and a detector array comprising a plurality of detector bins to obtain a representation of the subject including a plurality of image voxels. Contribution of a voxel to a detector bin in a computed forward projection or a detector bin to a voxel in a backprojection is determined by the intensity value assigned to the voxel, or to the detector bin, respectively, multiplied by the product of an area or volume of overlap and an additional weighting factor, and the area or volume of overlap is determined by overlap of the voxel with the area or volume of the image illuminated by a ray-wedge defined by detector bin edge rays.