The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 05, 2019

Filed:

Mar. 31, 2017
Applicant:

Conti Temic Microelectronic Gmbh, Nuremberg, DE;

Inventors:

Frederik Lange, Nuremberg, DE;

Robert Stueck, Lindau, DE;

Christian Exner, Bodolz, DE;

Alexander Bachmann, Lindau, DE;

Gregory Baratoff, Wangen, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/55 (2017.01); G06K 9/52 (2006.01); G06K 9/62 (2006.01); H04N 13/271 (2018.01); G06T 7/593 (2017.01); H04N 13/00 (2018.01);
U.S. Cl.
CPC ...
G06T 7/55 (2017.01); G06K 9/52 (2013.01); G06K 9/6215 (2013.01); G06T 7/593 (2017.01); H04N 13/271 (2018.05); H04N 2013/0081 (2013.01);
Abstract

In a method for determining a depth map from stereo images, the disparity for a pixel is selected from a predefined quantity or set of predefined discrete disparity values that are distributed over the entire predefined disparity value range, whereby the distribution is non-uniform or has at least two different distances or intervals between different adjacent disparity values. This method makes it possible to more precisely determine (with finer resolution) especially only those disparities for which a more precise determination is required.


Find Patent Forward Citations

Loading…