The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 05, 2019

Filed:

Jul. 06, 2016
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventors:

Tsuyoshi Kitamura, Utsunomiya, JP;

Akihiro Hatada, Utsunomiya, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G01B 11/25 (2006.01); G06K 9/46 (2006.01); B25J 9/16 (2006.01);
U.S. Cl.
CPC ...
G06K 9/00201 (2013.01); G01B 11/2513 (2013.01); B25J 9/1697 (2013.01); G05B 2219/40564 (2013.01); G06K 2209/401 (2013.01); Y10S 901/47 (2013.01);
Abstract

A measurement apparatus includes an optical combining unit configured to optically combine light from a first light source and light from a second light source, a forming unit configured to form pattern light using light from the first light source, a projection optical system configured to project the optically combined light onto an object, an imaging unit configured to image the object on which the pattern light is projected to capture a first image and to image the object illuminated with light from the second light source via the projection optical system to capture a second image, and a processing unit configured to correct the first image using the second image and to obtain information on a shape of the object based on the corrected first image.


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