The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 05, 2019
Filed:
Jun. 28, 2016
Altera Corporation, San Jose, CA (US);
Athanasius Spyrou, Sunnyvale, CA (US);
Altera Corporation, San Jose, CA (US);
Abstract
Electronic design automation tools may perform static timing analysis on an integrated circuit design. An integrated circuit design may have multiple nodes that can be traversed using a breadth-first search. To reduce the run-time of static timing analysis tools, tags recording arrival times associated with non-critical paths may have their consolidated in order to include only the critical timing information in the tag, thereby reducing the amount of data that is carried through to the analysis of the entire design. In a critical slack based merging method, a maximal arrival time associated with a circuit node may be compared to the remaining arrival times associated with the circuit node. Arrival times less than the maximal arrival time by an amount greater than a threshold amount may be deemed non-critical arrival times and may be removed from the tag for the circuit node.