The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 05, 2019

Filed:

Feb. 09, 2016
Applicant:

Tata Consultancy Services Limited, Mumbai, IN;

Inventors:

Pankaj Malhotra, Noida, IN;

Gautam Shroff, Bandhwari, IN;

Puneet Agarwal, Noida, IN;

Lovekesh Vig, Bandhwari, IN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01); G06F 17/18 (2006.01); G06K 9/00 (2006.01); G06K 9/62 (2006.01); G06N 3/04 (2006.01);
U.S. Cl.
CPC ...
G06F 17/30371 (2013.01); G06F 17/18 (2013.01); G06F 17/30324 (2013.01); G06K 9/0055 (2013.01); G06K 9/6284 (2013.01); G06N 3/0445 (2013.01);
Abstract

An anomaly detection system and method is provided. The system comprising: a hardware processor; and a memory storing instructions to configure the hardware processor, wherein the hardware processor receives a first time-series data comprising a first set of points and a second time-series data comprising a second set of points, computes a first set of error vectors for each point of the first set, and a second set of error vectors for each point of the second set, each set of error vectors comprising one or more prediction errors; estimates parameters based on the first set of error vectors comprising; applies (or uses) the parameters on the second set of error vectors; and detects an anomaly in the second time-series data when the parameters are applied on the second set of error vectors.


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