The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 05, 2019
Filed:
Mar. 20, 2015
International Business Machines Corporation, Armonk, NY (US);
Salman A. Baset, New York, NY (US);
Yu Deng, Yorktown Heights, NY (US);
Minkyong Kim, Scarsdale, NY (US);
Alla Segal, Mount Kisco, NY (US);
Charles O. Schulz, Ridgefield, CT (US);
Anca Sailer, Scarsdale, NY (US);
Long Wang, White Plains, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
An approach for ontological policy based data collection, processing, and negotiation for data in view of analytics is provided. The approach searches one or more data sources for data related to a data request. The approach collects data related to the data request from the one or more data sources. The approach determines whether one or more attributes generated from the data request match one or more descriptors associated with the data related to the data request. The approach creates one or more annotated ontologies for the data related to the data request. The approach displays a hierarchical visualization of the one or more annotated ontologies for the data related to the data request. The approach updates the one or more annotated ontologies for the data related to the data request based, at least in part, on an evaluation of the quality of the one or more data selections.