The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 05, 2019

Filed:

Jun. 09, 2016
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventor:

Dietmar Noll, Bad Soden-Salm, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01); G06F 7/00 (2006.01); G06F 11/07 (2006.01); H04L 29/08 (2006.01); G06F 11/30 (2006.01); G06F 11/34 (2006.01); H04L 12/24 (2006.01); H04L 12/26 (2006.01);
U.S. Cl.
CPC ...
G06F 11/079 (2013.01); G06F 11/0727 (2013.01); G06F 11/0754 (2013.01); G06F 11/0772 (2013.01); G06F 11/3034 (2013.01); G06F 11/3452 (2013.01); H04L 41/0631 (2013.01); H04L 41/142 (2013.01); H04L 43/0817 (2013.01); H04L 67/1097 (2013.01); G06F 11/3055 (2013.01); G06F 11/3409 (2013.01);
Abstract

A tool for improving identification of one or more storage system elements responsible for a performance degradation in a digital storage system. The tool records performance metric data for the one or more storage system elements in a database. The tool locates one or more outliers in the performance metric data for a focus time window using a statistical criterion. The tool calculates a problem contribution probability value for at least one of the one or more outliers. The tool determines a sequential list of outliers, wherein an order in the sequential list of outliers is determined using the problem contribution probability value.


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