The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 05, 2019
Filed:
May. 19, 2016
Boe Technology Group Co., Ltd., Beijing, CN;
Beijing Boe Optoelectronics Technology Co., Ltd., Beijing, CN;
Gang Yang, Beijing, CN;
Yong Song, Beijing, CN;
Jun Long, Beijing, CN;
Xijun An, Beijing, CN;
Hongkun Zhang, Beijing, CN;
Ziwang Liu, Beijing, CN;
BOE TECHNOLOGY GROUP CO., LTD., Beijing, CN;
BEIJING BOE OPTOELECTRONICS TECHNOLOGY CO., LTD., Beijing, CN;
Abstract
The present invention provides a method and a device for detecting defects in a pressing test of a touch screen. The method for detecting defects in a pressing test of a touch screen includes: Step S: acquiring, after each test point of the touch screen is tested, an image of a test region in which the test point is located, when performing the pressing test; Step S: identifying a quantity of abnormal points in the acquired image; and Step S: comparing the identified quantity of abnormal points with a quantity of abnormal points allowed in the pressing test, and determining that the touch screen has defects if the identified quantity of abnormal points exceeds the quantity of abnormal points allowed in the pressing test. The above method for detecting defects can check instantly and accurately whether defects arise on the touch screen during the pressing test.