The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 05, 2019

Filed:

Jun. 22, 2016
Applicant:

Enplas Corporation, Saitama, JP;

Inventors:

Yuki Fujii, Saitama, JP;

Yu Kamijo, Saitama, JP;

Assignee:

ENPLAS CORPORATION, Saitama, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G09F 13/04 (2006.01); G02F 1/1335 (2006.01); G02B 3/00 (2006.01);
U.S. Cl.
CPC ...
G02F 1/133611 (2013.01); G02B 3/00 (2013.01); G02F 1/133603 (2013.01); G02F 1/133606 (2013.01); G02F 2001/133607 (2013.01);
Abstract

A light flux controlling member that controls the light distribution of light emitted from a light emitting element is provided. This light flux controlling member has: an incidence surface constituted by an inner surface of a first concavity formed on a rear side of the light flux controlling member; an emission surface from which light incident on the incidence surface is emitted to the outside; and a second concavity formed on the rear side. The second concavity has a first inclined surface and a second inclined surface both inclined with respect to an imaginary straight line perpendicular to a central axis. The second inclined surface is formed in a region closer to the central axis than the first inclined surface. The first inclined surface is inclined at an angle reflecting at least part of incident light at the incidence surface and then Fresnel reflected at the emission surface.


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