The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 05, 2019
Filed:
Mar. 13, 2017
Applicant:
General Electric Company, Schenectady, NY (US);
Inventors:
Geng Fu, Rexford, NY (US);
Xue Rui, Clifton Park, NY (US);
Yannan Jin, Schenectady, NY (US);
Jianjun Guo, Ballston Spa, NY (US);
Peter Michael Edic, Albany, NY (US);
Brian David Yanoff, Schenectady, NY (US);
Assignee:
GENERAL ELECTRIC COMPANY, Schenectady, NY (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01T 1/24 (2006.01); G01T 1/36 (2006.01); G01T 7/00 (2006.01);
U.S. Cl.
CPC ...
G01T 1/247 (2013.01); G01T 1/241 (2013.01); G01T 1/366 (2013.01); G01T 7/005 (2013.01);
Abstract
The present approach relates to the use of reference pixels provided between the primary pixels of a detector panel. Coincidence circuitry or logic may be employed so that the measured signal arising from the same X-ray event may be properly, that is the signal measured at both a reference and primary pixel may be combined so as to provide an accurate estimate of the measured signal, at an appropriate location on the detector panel.