The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 05, 2019

Filed:

Apr. 17, 2014
Applicant:

National Taiwan University, Taipei, TW;

Inventors:

Jyh-Horng Chen, Taipei, TW;

Tzi-Dar Chiueh, Taipei, TW;

Edzer Lienson Wu, Taipei, TW;

Yun-An Huang, Taipei, TW;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 33/561 (2006.01); G01R 33/48 (2006.01); G01R 33/565 (2006.01);
U.S. Cl.
CPC ...
G01R 33/561 (2013.01); G01R 33/4818 (2013.01); G01R 33/4824 (2013.01); G01R 33/56545 (2013.01);
Abstract

A method and apparatus for single carrier wideband magnetic resonance imaging (MRI) data acquisition are provided. The method includes the following steps: exciting a slice or slab with the use of RF pulse and a slice/slab selection gradient; applying a phase encoding gradient along a phase encoding direction and reducing a FOV along the phase encoding direction by a factor of W through k-space subsampling; applying a frequency encoding gradient along a frequency encoding direction and increasing a FOV along the frequency encoding direction by a factor of W; and applying a separation gradient along the phase encoding direction during the frequency encoding duration and k-space data acquisition.


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