The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 05, 2019

Filed:

Nov. 28, 2016
Applicant:

Q Bio, Inc, Millbrae, CA (US);

Inventors:

Jeffrey Howard Kaditz, Wilson, WY (US);

Athanasios Polymeridis, Moscow, RU;

Jorge Fernandez Villena, Somerville, MA (US);

Assignee:

Q Bio, Inc., Redwood City, CA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 24/08 (2006.01); G01R 33/48 (2006.01); G01R 33/465 (2006.01); G01R 33/56 (2006.01); G01R 33/44 (2006.01); G01R 33/563 (2006.01);
U.S. Cl.
CPC ...
G01R 33/5608 (2013.01); G01N 24/08 (2013.01); G01R 33/48 (2013.01); G01R 33/448 (2013.01); G01R 33/465 (2013.01); G01R 33/4804 (2013.01); G01R 33/5602 (2013.01); G01R 33/56358 (2013.01);
Abstract

During operation, a system may apply an external magnetic field and an RF pulse sequence to a sample. Then, the system may measure at least a component of a magnetization associated with the sample, such as MR signals of one or more types of nuclei in the sample. Moreover, the system may calculate at least a predicted component of the magnetization for voxels associated with the sample based on the measured component of the magnetization, a forward model, the external magnetic field and the RF pulse sequence. Next, the system may solve an inverse problem by iteratively modifying the parameters associated with the voxels in the forward model until a difference between the predicted component of the magnetization and the measured component of the magnetization is less than a predefined value. Note that the calculations may be performed concurrently with the measurements and may not involve performing a Fourier transform.


Find Patent Forward Citations

Loading…