The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 05, 2019
Filed:
Feb. 17, 2016
General Electric Company, Schenectady, NY (US);
Yoshihiro Tomoda, Hino, JP;
Masanori Ozaki, Hino, JP;
GENERAL ELECTRIC COMPANY, Schenectady, NY (US);
Abstract
There is provided a scan condition determining apparatus for a magnetic resonance imaging system comprising accepting means for accepting specification of a desired scan time; and searching means for searching for a second scan condition based on a first scan condition defined before the specification, by adjusting values of parameters affecting a scan time or a signal-to-noise ratio of signals obtained by a scan, said second scan condition being one with which the scan time approximates within an allowable range or matches the desired scan time, and besides, a lowest value of a relative signal-to-noise ratio of the signals approximates within an allowable range or matches a lowest value of the relative signal-to-noise ratio of the signals estimated based on the first scan condition. The parameters include, for example, any one of a number of times of addition, a y-axis direction resolution, a repetition time, and a number of data acquisition passes.