The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 05, 2019
Filed:
Oct. 14, 2014
Koninklijke Philips N.v., Eindhoven, NL;
Kay Nehrke, Hamburg, DE;
Peter Bornert, Hamburg, DE;
Koninklijke Philips N.V., Eindhoven, NL;
Abstract
The invention relates to a method of MR imaging of an object () placed in the examination volume of a MR device (). It is the object of the invention to provide an improved MR-based temperature mapping method. The method of the invention comprises the steps of: subjecting the object () to an imaging sequence of RF pulses and switched magnetic field gradients, which imaging sequence is a stimulated echo sequence including: a) at least two preparation RF pulses (a) radiated toward the object () during a preparation period (), and b) one or more reading RF pulses (β) radiated toward the object () during an acquisition period () temporally subsequent to the preparation period (); acquiring at least two MR signals during the acquisition period (), wherein the two MR signals are either (i) a FID signal (I, FID) and a stimulated echo signal (I) or (ii) two stimulated echo signals (STE, STE*); and deriving a temperature map indicating the spatial distribution of the temperature within the object () from the at least two acquired MR signals. Moreover, the invention relates to a MR device () and to a computer program for a MR device ().