The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 05, 2019

Filed:

Dec. 03, 2013
Applicant:

Happyjapan, Inc., Yamagata-shi, JP;

Inventors:

Shouhei Matsumoto, Yamagata, JP;

Mitsuo Koizumi, Yamagata, JP;

Fumiaki Togashi, Yamagata, JP;

Satoshi Ueno, Yamagata, JP;

Keitaro Harada, Yamagata, JP;

Masayoshi Yokoo, Yamagata, JP;

Assignee:

HappyJapan Inc., Yamagata-shi, Yamagata, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G01R 31/308 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2891 (2013.01); G01R 31/2887 (2013.01); G01R 31/2893 (2013.01); G01R 31/308 (2013.01);
Abstract

An IC handler () of the present invention transfers an IC device (D) to a test head (). The test head () is provided with a socket (), which has a placing surface () having the IC device (D) placed thereon, and which attaches the IC device (D) placed on the placing surface () to the test head (). The IC handler () is provided with a non-contact displacement meter () that is disposed by being spaced apart from the socket () in the direction perpendicular to the placing surface (). The non-contact displacement meter () measures a distance from the non-contact displacement meter () to the IC device (D) placed on the placing surface () by emitting a laser beam toward the placing surface () of the socket ().


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