The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 05, 2019
Filed:
Sep. 29, 2015
Ecole Supérieure DE Physique ET DE Chimie Industrielles DE LA Ville DE Paris—espci Paristech, Paris, FR;
Albert Claude Boccara, Paris, FR;
Martine Boccara, Paris, FR;
ECOLE SUPÉRIEURE DE PHYSIQUE ET DE CHIMIE INDUSTRIELLES DE LA VILLE DE PARIS, Paris, FR;
CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE, Paris, FR;
UNIVERSITÉ DE PIERRE ET MARIE CURIE, Paris, FR;
ECOLE NORMALE SUPÉRIEURE, Paris, FR;
INSTITUT NATIONAL DE LA SANTÉ ET DE LA RECHERCHE MÉDICALE, Paris, FR;
Abstract
A device for optically detecting in transmission nanoparticles moving in a fluid sample includes a light source for emitting a spatially incoherent beam for illuminating the sample; an imaging optical system; and a two-dimensional optical detector. The imaging optical system includes a microscope objective. The two-dimensional optical detector includes a detection plane conjugated with an object focal plane of the microscope objective by said imaging optical system. The two-dimensional optical detector allows a sequence of images of an analysis volume of the sample to be acquired, each image resulting from optical interferences between the illuminating beam incident on the sample and the beams scattered by each of the nanoparticles present in the analysis volume during a preset duration shorter than one millisecond. The device further includes an image processor that allows an average of a sequence of said images to be taken and said average to be subtracted from each image in order to determine, for each nanoparticle of the analysis volume, the amplitude of the scattered beam.