The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 05, 2019
Filed:
Nov. 30, 2016
Thales, Courbevoie, FR;
Jérome Bourderionnet, Sucy en Brie, FR;
Arnaud Brignon, Bourg-la-Reine, FR;
Marie Antier-Murgey, Antony, FR;
THALES, Courbevoie, FR;
Abstract
A method for measuring the delay between N pulses having a duration less than 100 picoseconds comprises the steps: collimated emission of the pulses having the same repetition frequency, emission of a reference pulse having the same repetition frequency capable of producing interference fringes with each of the pulses, for each of the pulses, detection, by a detector, of the coherent sum of this pulse with the reference pulse, this sum producing the interference fringes, the fringes originating from each of the pulses being distinguishable from one another. The reference pulse is emitted with an adjustable delay, and the method further comprises: for each delay, simultaneous measurement for the pulses of N contrasts of the interference fringes, for each of the pulses, a delay value between this pulse and the reference pulse is determined by the delay corresponding to the maximum contrast.