The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 05, 2019

Filed:

Feb. 04, 2014
Applicant:

Omron Corporation, Kyoto-shi, Kyoto, JP;

Inventors:

Hiroshi Sameshima, Kyoto, JP;

Yasuhiro Kawabata, Kyoto, JP;

Tomohiro Ozaki, Tokyo, JP;

Ryota Akai, Kyoto, JP;

Teruki Hasegawa, Tokyo, JP;

Assignee:

OMRON Corporation, Kyoto, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01D 21/00 (2006.01); G01D 3/10 (2006.01);
U.S. Cl.
CPC ...
G01D 21/00 (2013.01); G01D 3/10 (2013.01);
Abstract

A controller switches a measurement unit from a non-measurement state to a measurement state to start measurement processing of the measurement target physical amount when a trigger condition having a lowest variation level for a steady state is satisfied in plural trigger conditions set according to a trigger physical amount detected by a trigger detector, and the controller interrupts currently-performed measurement processing to start measurement processing corresponding to a trigger condition having a higher variation level when the trigger condition having the variation level for the steady state higher than that of the trigger condition corresponding to the currently-performed measurement processing is satisfied during performance of the measurement processing.


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