The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 05, 2019
Filed:
Jul. 14, 2016
United Technologies Corporation, Farmington, CT (US);
Steven Taffet, South Windsor, CT (US);
Anton Banks, Manchester, CT (US);
United Technologies Corporation, Farmington, CT (US);
Abstract
Systems and methods for depth measurement are described herein. A depth measurement device may comprise a first light source configured to direct a first beam of light, a second light source configured to direct a second beam of light, and a mirror. The mirror may be for viewing at least one of the first beam of light and the second beam of light. The depth measurement device may further comprise a housing. The depth measurement device may further comprise an eyepiece. The first beam of light and the second beam of light may be configured to intersect at a desired location. The eyepiece may be configured to maintain a consistent line-of-sight between the eyepiece, the mirror, and the desired location. In various embodiments, the second beam of light may be oriented at an acute angle with respect to the first beam of light.