The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 05, 2019
Filed:
Apr. 09, 2014
Carl Zeiss Industrielle Messtechnik Gmbh, Oberkochen, DE;
Carl Zeiss Industrial Metrology, Llc, Maple Grove, MN (US);
Marcin B. Bauza, Plymouth, MN (US);
Richard H. Knebel, Brighton, MI (US);
Thomas Engel, Aalen, DE;
Nils Haverkamp, Aalen, DE;
Rainer Sagemueller, Aalen, DE;
Dominik Seitz, Schwaebisch Gmuend, DE;
Tobias Held, Noerdlingen, DE;
Carl Zeiss Industrielle Messtechnik GmbH, Oberkochen, DE;
Carl Zeiss Industrial Metrology, LLC, Maple Grove, MN (US);
Abstract
A method and an arrangement for producing a workpiece using additive manufacturing techniques involve in-process measurement in order to determine individual characteristics of one or more workpiece layers. In particular, dimensional and/or geometrical characteristics of a workpiece layer are measured before the next workpiece layer is produced. Advantageously, the measurement results are fed back into the production process in order to increase accuracy and precision of the production process.