The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 05, 2019

Filed:

Apr. 26, 2017
Applicant:

Optinav Sp. Z O.o., Slupsk, PL;

Inventor:

Mariusz Bodjanski, Zielonka, PL;

Assignee:

OPTINAV SP. Z O.O., Slupsk, PL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 90/00 (2016.01); G06T 7/00 (2017.01); A61B 34/20 (2016.01); A61B 90/92 (2016.01); G06T 7/13 (2017.01); G06T 7/90 (2017.01); G06T 7/70 (2017.01); H04N 7/18 (2006.01);
U.S. Cl.
CPC ...
A61B 34/20 (2016.02); A61B 90/39 (2016.02); A61B 90/92 (2016.02); G06T 7/13 (2017.01); G06T 7/70 (2017.01); G06T 7/90 (2017.01); H04N 7/181 (2013.01); A61B 2034/2055 (2016.02); A61B 2034/2057 (2016.02); A61B 2034/2065 (2016.02); A61B 2090/3937 (2016.02); A61B 2090/3983 (2016.02); G06T 2207/10016 (2013.01); G06T 2207/30204 (2013.01);
Abstract

An elliptical, optical-tracking marker comprises an inner marker body that is filled with radially spread color spectrum points with respect to a center point of the inner marker body. A color value of each spectrum point of the inner marker body is calculated as a function of an angle defined between a horizontal line crossing the central point of the inner marker body and a line crossing the central point of the inner marker as well as the given pixel in such a manner, that the color values of the respective spectrum points vary in accordance with a sinusoidal pattern along an elliptical path around the center point, in particular along a circular path centered around the center point. A method and a system for determining a 3D position of an object in space use the characteristics of this marker by detecting and analyzing the sinusoidal pattern.


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