The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 05, 2019

Filed:

Aug. 06, 2015
Applicant:

Hitachi, Ltd., Tokyo, JP;

Inventors:

Shinichi Kojima, Tokyo, JP;

Keisuke Yamakawa, Tokyo, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01); A61B 6/03 (2006.01);
U.S. Cl.
CPC ...
A61B 6/4241 (2013.01); A61B 6/032 (2013.01); A61B 6/542 (2013.01); A61B 6/463 (2013.01);
Abstract

Provided is a photon counting CT device for estimating an exposure dose to a subject, precisely in a simple configuration, irrespective of a spectrum shape of X-rays being applied. An exposure dose derived from the X-rays with predetermined intensity is obtained in every energy range provided in advance, and held as exposure per band data. When an imaging condition is provided, X-rays are applied in accordance with the imaging condition thus provided, and a photon count (intensity) of the incident X-rays as to each energy range is obtained, in the shape of spectrum of the X-rays applied to a detector without placing the subject. The intensity of the incident X-rays is multiplied by the exposure per band, and the results as to all the energy ranges are added up. Accordingly, the exposure dose caused by the X-rays being applied in accordance with the provided imaging condition is estimated.


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