The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 05, 2019

Filed:

Jun. 22, 2015
Applicant:

Hitachi, Ltd., Tokyo, JP;

Inventors:

Shinji Kurokawa, Tokyo, JP;

Yushi Tsubota, Tokyo, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01); A61B 6/03 (2006.01); A61B 6/04 (2006.01);
U.S. Cl.
CPC ...
A61B 6/4021 (2013.01); A61B 6/032 (2013.01); A61B 6/0407 (2013.01); A61B 6/4429 (2013.01); A61B 6/461 (2013.01); A61B 6/5205 (2013.01); A61B 6/54 (2013.01); A61B 6/42 (2013.01); A61B 6/467 (2013.01); A61B 6/5258 (2013.01);
Abstract

An X-ray CT device which improves resolution in a peripheral region distant from a rotation center. According to an FFS method of moving an X-ray focal point, a gap width of projection positions on an X-ray detector of a first X-ray trajectory from the X-ray focal point of a first view and a second X-ray trajectory from the X-ray focal point of a second view is obtained. A position of the X-ray focal point of the first and second views is set so that a gap widthof the projection positions on the X-ray detector of the first X-ray trajectory and the second X-ray trajectory which pass through a point within a predetermined first region close to the X-ray focal point from the rotation center is closer to (N−½) times (N=any one of 1, 2, 3, . . . ) of a width of a channel of the X-ray detector.


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