The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 26, 2019
Filed:
May. 08, 2017
Applicant:
Dgs Global Systems, Inc., Beltsville, MD (US);
Inventors:
Ronald C. Dzierwa, Baltimore, MD (US);
Gabriel R. Garcia, Severna Park, MD (US);
Daniel Carbajal, Severna Park, MD (US);
Assignee:
DGS GLOBAL SYSTEMS, INC., Beltsville, MD (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 17/309 (2015.01); H04W 16/14 (2009.01); G06N 99/00 (2010.01); H04B 1/06 (2006.01); G06F 17/14 (2006.01); G06N 5/02 (2006.01); H04W 64/00 (2009.01); H04B 17/23 (2015.01); H04B 17/27 (2015.01); H04B 17/318 (2015.01); H04B 17/391 (2015.01);
U.S. Cl.
CPC ...
H04W 16/14 (2013.01); G06F 17/142 (2013.01); G06N 5/022 (2013.01); G06N 99/005 (2013.01); H04B 1/06 (2013.01); H04B 17/23 (2015.01); H04B 17/27 (2015.01); H04B 17/309 (2015.01); H04B 17/318 (2015.01); H04W 64/006 (2013.01); H04B 17/3911 (2015.01);
Abstract
Devices and methods enable optimizing a signal of interest based on identifying and analyzing the signal of interest based on radio frequency energy measurements. Signal data is compared with stored data to identify the signal of interest. Signal degradation data is calculated based on noise figure parameters, hardware parameters and environment parameters. The signal of interest is optimized based on the signal degradation data. Terrain data may also be used for optimizing the signal of interest.