The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 26, 2019

Filed:

Mar. 01, 2018
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventors:

Takashi Moriyama, Yokohama, JP;

Masaaki Minowa, Kawasaki, JP;

Takeshi Ichikawa, Hachioji, JP;

Masahiro Ogawa, Ebina, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 27/146 (2006.01); H04N 5/374 (2011.01); H04N 5/33 (2006.01); H04N 5/265 (2006.01); H04N 5/232 (2006.01);
U.S. Cl.
CPC ...
H01L 27/14607 (2013.01); H01L 27/1461 (2013.01); H01L 27/14643 (2013.01); H01L 27/14645 (2013.01); H01L 27/14649 (2013.01); H01L 27/14689 (2013.01); H04N 5/23293 (2013.01); H04N 5/265 (2013.01); H04N 5/33 (2013.01); H04N 5/374 (2013.01);
Abstract

A solid-state imaging apparatus, comprising a first semiconductor region of a first conductivity type provided on a substrate by an epitaxial growth method, a second semiconductor region of the first conductivity type provided on the first semiconductor region, and a third semiconductor region of a second conductivity type provided in the second semiconductor region so as to form a pn junction with the second semiconductor region, wherein the first semiconductor region is formed such that an impurity concentration decreases from a side of the substrate to a side of the third semiconductor region, and an impurity concentration distribution in the second semiconductor region is formed by an ion implantation method.


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