The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 26, 2019
Filed:
Jan. 11, 2017
Applicant:
Samsung Electronics Co., Ltd., Suwon-si, KR;
Inventors:
Dae Seo Park, Suwon-si, KR;
Song Ho Jeong, Hwaseong-si, KR;
Oh Seok Kwon, Hwaseong-si, KR;
Jong Tae Kim, Hwaseong-si, KR;
Choo Ho Kim, Yongin-si, KR;
Assignee:
SAMSUNG ELECTRONICS CO., LTD., Gyeonggi-do, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); H01L 21/66 (2006.01); G01N 21/64 (2006.01); G01N 21/95 (2006.01); H01L 33/56 (2010.01);
U.S. Cl.
CPC ...
H01L 22/24 (2013.01); G01N 21/64 (2013.01); G01N 21/95 (2013.01); H01L 33/56 (2013.01); G01N 2201/062 (2013.01); H01L 2933/0033 (2013.01);
Abstract
A test apparatus includes a lighting unit radiating light on a to-be-tested object having a light transmitting resin containing a light conversion material; a camera unit obtaining an image of the to-be-tested object while the light transmitting resin is emitted by receiving light emitted by the lighting unit; and a controller determining whether the to-be-tested object is defective by calculating gray values from the image obtained by the camera unit.