The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 26, 2019
Filed:
Jul. 05, 2018
Mitsubishi Electric Research Laboratories, Inc., Cambridge, MA (US);
Pu Wang, Cambridge, MA (US);
Toshiaki Koike Akino, Lexington, MA (US);
Haoyu Fu, Cambridge, MA (US);
Philip Orlik, Cambridge, MA (US);
Mistubishi Electric Research Laboratories, Inc., Cambridge, MA (US);
Abstract
A scanner includes an emitter configured to emit a wave in a direction of propagation to penetrate layers of a structure of a target object and a receiver configured to measure intensities of the wave reflected by the layers of the target object. The scanner also includes a hardware processor configured to partition the intensities of the reflected wave into a set of segments, such that each segment is the reflection from a corresponding layer of the target object, defining a multi-layered structure of the target object; and reconstruct images of the layers of the target object from corresponding segments using a joint-layer hierarchical image recovery that prevents an increase in sparsity of the layers of the target object in the direction of propagation of the wave. An output interface is configured to render the reconstructed images of layers of the target object.