The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 26, 2019

Filed:

Jun. 23, 2015
Applicant:

Toshiba Medical Systems Corporation, Otawara-shi, JP;

Inventors:

Takuzo Takayama, Utsunomiya, JP;

Yasuo Saito, Nasushiobara, JP;

Emi Tamura, Nasushiobara, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 11/00 (2006.01); A61B 6/03 (2006.01); A61B 6/00 (2006.01); G01N 23/046 (2018.01); G01T 1/16 (2006.01); H05G 1/08 (2006.01);
U.S. Cl.
CPC ...
G06T 11/003 (2013.01); A61B 6/032 (2013.01); A61B 6/4241 (2013.01); A61B 6/482 (2013.01); G01N 23/046 (2013.01); G01T 1/1606 (2013.01); G06T 11/005 (2013.01); H05G 1/08 (2013.01); A61B 6/4035 (2013.01); A61B 6/4233 (2013.01); G06T 2211/408 (2013.01); G06T 2211/412 (2013.01);
Abstract

An X-ray computed tomography (CT) apparatus includes a detector, and processing circuitry. The detector is configured to output, at each incidence of an X-ray photon, a signal enabling measurement of an energy value of the X-ray photon. Processing circuitry is configured to estimate an energy range to be used for imaging based on an imaging condition and to reconstruct X-ray CT image data using counting information to which an energy value within the energy range is associated among pieces of counting information that are collected from individual signals output by the detector at each incidence of an X-ray photon that has been irradiated from an X-ray tube and has passed through a subject, and in which a counting value and an energy value of X-ray photons incident to the detector are associated with each other.


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