The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 26, 2019
Filed:
Jun. 01, 2016
International Business Machines Corporation, Armonk, NY (US);
Aleksandr Y. Aravkin, Seattle, WA (US);
Chung-Ching Lin, White Plains, NY (US);
Karthikeyan N. Ramamurthy, Ossining, NY (US);
Sharathchandra U. Pankanti, Darien, CT (US);
Raphael Viguier, Bronx, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method includes obtaining two-dimensional measurements of a given scene from sensors, the given scene comprising a plurality of scene points, distributing the given scene into bundles each associated with at least one sensor and at least one scene point, establishing constraints associated with the sensors and the plurality of scene points that are associated with two different bundles, estimating, individually for each of the bundles, a set of parameters for the at least one sensor and the at least one scene point associated with that bundle utilizing at least one of the two-dimensional measurements, generating a consensus parameter set for the one or more sensors and the plurality of scene points based on the estimated parameter sets, the established constraints being utilized to reconcile differences in parameter values in the estimated parameter sets, and producing a three-dimensional representation of the given scene utilizing the consensus parameter set.